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    An X-ray photoelectron spectroscopy depth profile study on the InGeNi/(110) cleaved GaAs structure

    New search for: Logofatu, Constantin
    New search for: Ghita, Rodica V.
    New search for: Cotirlan, Costel

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    An X-ray photoelectron spectroscopy depth profile study on the InGeNi/(110) cleaved GaAs structure

    New search for: Logofatu, Constantin
    New search for: Ghita, Rodica V.
    New search for: Cotirlan, Costel

    Access

    Access via TIB
    Check availability in my library
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    An X-ray photoelectron spectroscopy depth profile study on the InGeNi/(110) cleaved GaAs structure

    New search for: Logofatu, Constantin
    New search for: Ghita, Rodica V.
    New search for: Cotirlan, Costel

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
    Title:

    An X-ray photoelectron spectroscopy depth profile study on the InGeNi/(110) cleaved GaAs structure

    Contributors:

    Negrila, Constantin Catalin (author) / Lazarescu, Mihail Florin (author) / Logofatu, Constantin (author) / Ghita, Rodica V. (author) / Cotirlan, Costel (author)

    Published in:

    Materials science in semiconductor processing ; 82 ; 62-66

    Publication date:

    2018-01-01

    Size:

    5 pages

    ISSN:

    1369-8001

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.38152

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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