A platform for research: civil engineering, architecture and urbanism
Local charge trapping in Ge nanoclustersdetected by Kelvin probe force microscopy
Local charge trapping in Ge nanoclustersdetected by Kelvin probe force microscopy
Local charge trapping in Ge nanoclustersdetected by Kelvin probe force microscopy
Kondratenko, S.V. (author) / Lysenko, V.S. (author) / Kozyrev, Yu. N. (author) / Kratzer, M. (author) / Storozhuk, D.P. (author) / Iliash, S.A. (author) / Czibula, C. (author) / Teichert, C. (author)
Applied surface science ; 389 ; 783-789
2016-01-01
7 pages
Article (Journal)
English
DDC:
620.44
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Local charge trapping in Ge nanoclustersdetected by Kelvin probe force microscopy
British Library Online Contents | 2016
|Local charge trapping in Ge nanoclustersdetected by Kelvin probe force microscopy
British Library Online Contents | 2016
|Local charge trapping in Ge nanoclustersdetected by Kelvin probe force microscopy
British Library Online Contents | 2016
|Kelvin Probe Force Microscopy of Molecular Surfaces
British Library Online Contents | 1999
|Kelvin probe force microscopy using near-field optical tips
British Library Online Contents | 2000
|