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Kelvin probe force microscopy using near-field optical tips
Kelvin probe force microscopy using near-field optical tips
Kelvin probe force microscopy using near-field optical tips
Shikler, R. (author) / Rosenwaks, Y. (author)
APPLIED SURFACE SCIENCE ; 157 ; 256-262
2000-01-01
7 pages
Article (Journal)
English
DDC:
621.35
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