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Evolution of arsenic in high fluence plasma immersion ion implanted silicon: Behavior of the as-implanted surface
Evolution of arsenic in high fluence plasma immersion ion implanted silicon: Behavior of the as-implanted surface
Evolution of arsenic in high fluence plasma immersion ion implanted silicon: Behavior of the as-implanted surface
Vishwanath, V. (author) / Demenev, E. (author) / Giubertoni, D. (author) / Vanzetti, L. (author) / Koh, A.L. (author) / Steinhauser, G. (author) / Pepponi, G. (author) / Bersani, M. (author) / Meirer, F. (author) / Foad, M.A. (author)
Applied surface science ; 355 ; 792-799
2015-01-01
8 pages
Article (Journal)
English
DDC:
620.44
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