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    X-ray photoelectron spectroscopy analysis of the effect of photoresist passivation on InGaZnO thin-film transistors

    New search for: Xiao, Peng
    New search for: Huang, Junhua
    New search for: Dong, Ting
    New search for: Yuan, Jian
    New search for: Yan, Dong
    New search for: Xie, Jianing
    New search for: Tan, Haishu

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    X-ray photoelectron spectroscopy analysis of the effect of photoresist passivation on InGaZnO thin-film transistors

    New search for: Xiao, Peng
    New search for: Huang, Junhua
    New search for: Dong, Ting
    New search for: Yuan, Jian
    New search for: Yan, Dong
    New search for: Xie, Jianing
    New search for: Tan, Haishu

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    X-ray photoelectron spectroscopy analysis of the effect of photoresist passivation on InGaZnO thin-film transistors

    New search for: Xiao, Peng
    New search for: Huang, Junhua
    New search for: Dong, Ting
    New search for: Yuan, Jian
    New search for: Yan, Dong
    New search for: Xie, Jianing
    New search for: Tan, Haishu

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

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    Document information
    Title:

    X-ray photoelectron spectroscopy analysis of the effect of photoresist passivation on InGaZnO thin-film transistors

    Contributors:

    Xiao, Peng (author) / Huang, Junhua (author) / Dong, Ting (author) / Yuan, Jian (author) / Yan, Dong (author) / Xie, Jianing (author) / Tan, Haishu (author)

    Published in:

    Applied surface science ; 471 ; 403-407

    Publication date:

    2019-01-01

    Size:

    5 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.44

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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