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X-ray photoelectron spectroscopy analysis of the effect of photoresist passivation on InGaZnO thin-film transistors
X-ray photoelectron spectroscopy analysis of the effect of photoresist passivation on InGaZnO thin-film transistors
X-ray photoelectron spectroscopy analysis of the effect of photoresist passivation on InGaZnO thin-film transistors
Xiao, Peng (Autor:in) / Huang, Junhua (Autor:in) / Dong, Ting (Autor:in) / Yuan, Jian (Autor:in) / Yan, Dong (Autor:in) / Xie, Jianing (Autor:in) / Tan, Haishu (Autor:in)
Applied surface science ; 471 ; 403-407
01.01.2019
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.44
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