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Generalised residual stress depth profiling at the nanoscale using focused ion beam milling

Salvati, E. / Romano-Brandt, L. / Mughal, M.Z. / Sebastiani, M. / Korsunsky, A.M.

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Generalised residual stress depth profiling at the nanoscale using focused ion beam milling

Salvati, E. / Romano-Brandt, L. / Mughal, M.Z. / Sebastiani, M. / Korsunsky, A.M.

Generalised residual stress depth profiling at the nanoscale using focused ion beam milling

Salvati, E. / Romano-Brandt, L. / Mughal, M.Z. / Sebastiani, M. / Korsunsky, A.M.

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Check availability in my library

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Document information

Title:

Generalised residual stress depth profiling at the nanoscale using focused ion beam milling

Contributors:

Salvati, E. (author) / Romano-Brandt, L. (author) / Mughal, M.Z. (author) / Sebastiani, M. (author) / Korsunsky, A.M. (author)

Published in:

Journal of the mechanics and physics of solids ; 125 ; 488-501

Publication date:

2019-01-01

Size:

14 pages

ISSN:

0022-5096

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 531.05

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