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    The effect of atomic density gradient in electromigration

    New search for: Zhang, Yuanxiang
    New search for: Liu, Yong
    New search for: Liang, Lihua
    New search for: Fan, Xuejun

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    The effect of atomic density gradient in electromigration

    New search for: Zhang, Yuanxiang
    New search for: Liu, Yong
    New search for: Liang, Lihua
    New search for: Fan, Xuejun

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    The effect of atomic density gradient in electromigration

    New search for: Zhang, Yuanxiang
    New search for: Liu, Yong
    New search for: Liang, Lihua
    New search for: Fan, Xuejun

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    The effect of atomic density gradient in electromigration

    Contributors:

    Zhang, Yuanxiang (author) / Liu, Yong (author) / Liang, Lihua (author) / Fan, Xuejun (author)

    Published in:

    International journal of materials and structural integrity ; 6 ; 36-53

    Publication date:

    2012-01-01

    Size:

    18 pages

    ISSN:

    1745-0055

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.112

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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