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    The effect of atomic density gradient in electromigration

    New search for: Zhang, Y.
    New search for: Liu, Y.
    New search for: Liang, L.
    New search for: Fan, X.

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    The effect of atomic density gradient in electromigration

    New search for: Zhang, Y.
    New search for: Liu, Y.
    New search for: Liang, L.
    New search for: Fan, X.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    The effect of atomic density gradient in electromigration

    New search for: Zhang, Y.
    New search for: Liu, Y.
    New search for: Liang, L.
    New search for: Fan, X.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
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    Document information
    Title:

    The effect of atomic density gradient in electromigration

    Contributors:

    Zhang, Y. (author) / Liu, Y. (author) / Liang, L. (author) / Fan, X. (author)

    Published in:

    INTERNATIONAL JOURNAL OF MATERIALS AND STRUCTURAL INTEGRITY ; 6 ; 36-53

    Publication date:

    2012-01-01

    Size:

    18 pages

    ISSN:

    1745-0055

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.112

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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