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ABNORMALITY DETECTION DEVICE FOR STRUCTURE, ABNORMALITY DETECTION SYSTEM FOR STRUCTURE, ABNORMALITY DETECTION METHOD FOR STRUCTURE, AND ABNORMALITY DETECTION PROGRAM FOR STRUCTURE
To detect an abnormality of a structure with accuracy.SOLUTION: An abnormality detection device 100 is provided with a first accelerometer 31, a second accelerometer 32, an acquisition part 101, a conversion part 102, and a detector 106. The first accelerometer 31 is arranged in a structure 4. The second accelerometer 32 is arranged in the structure 4 at a location below the first accelerometer 31 spaced by a prescribed distance or more from the first accelerometer 31. The acquisition part 101 acquires, from each of the first accelerometer 31 and the second accelerometer 32, vibration data G1, G2 of the prescribed direction. The conversion part 102 performs Fourier conversion on the vibration data G1, G2. The detector 106 detects an occurrence of an abnormality of the structure 4 on the basis of a first spectrum F1 and a second spectrum F2 generated by the conversion part 102. The structure 4 is supported at least at its bottom end. The first spectrum F1 corresponds to the vibration data G1 of the first accelerometer 31. The second spectrum F2 corresponds to the vibration data G2 of the second accelerometer 32.SELECTED DRAWING: Figure 1
【課題】構造体の異常を正確に検出する。【解決手段】異常検出装置１００は、第１加速度計３１と、第２加速度計３２と、取得部１０１と、変換部１０２と、検出部１０６とを備える。第１加速度計３１は、構造体４に配置される。第２加速度計３２は、構造体４において、第１加速度計３１から所定距離以上離間して、第１加速度計３１の下方に配置される。取得部１０１は、第１加速度計３１及び第２加速度計３２の各々から所定方向の振動データＧ１、Ｇ２を取得する。変換部１０２は、振動データＧ１、Ｇ２にフーリエ変換を行う。検出部１０６は、変換部１０２によって生成された第１スペクトルＦ１と第２スペクトルＦ２とに基づき、構造体４の異常の発生を検出する。構造体４は、少なくとも下端が支持される。第１スペクトルＦ１は、第１加速度計３１の振動データＧ１に対応する。第２スペクトルＦ２は、第２加速度計３２の振動データＧ２に対応する。【選択図】図１
ABNORMALITY DETECTION DEVICE FOR STRUCTURE, ABNORMALITY DETECTION SYSTEM FOR STRUCTURE, ABNORMALITY DETECTION METHOD FOR STRUCTURE, AND ABNORMALITY DETECTION PROGRAM FOR STRUCTURE
To detect an abnormality of a structure with accuracy.SOLUTION: An abnormality detection device 100 is provided with a first accelerometer 31, a second accelerometer 32, an acquisition part 101, a conversion part 102, and a detector 106. The first accelerometer 31 is arranged in a structure 4. The second accelerometer 32 is arranged in the structure 4 at a location below the first accelerometer 31 spaced by a prescribed distance or more from the first accelerometer 31. The acquisition part 101 acquires, from each of the first accelerometer 31 and the second accelerometer 32, vibration data G1, G2 of the prescribed direction. The conversion part 102 performs Fourier conversion on the vibration data G1, G2. The detector 106 detects an occurrence of an abnormality of the structure 4 on the basis of a first spectrum F1 and a second spectrum F2 generated by the conversion part 102. The structure 4 is supported at least at its bottom end. The first spectrum F1 corresponds to the vibration data G1 of the first accelerometer 31. The second spectrum F2 corresponds to the vibration data G2 of the second accelerometer 32.SELECTED DRAWING: Figure 1
【課題】構造体の異常を正確に検出する。【解決手段】異常検出装置１００は、第１加速度計３１と、第２加速度計３２と、取得部１０１と、変換部１０２と、検出部１０６とを備える。第１加速度計３１は、構造体４に配置される。第２加速度計３２は、構造体４において、第１加速度計３１から所定距離以上離間して、第１加速度計３１の下方に配置される。取得部１０１は、第１加速度計３１及び第２加速度計３２の各々から所定方向の振動データＧ１、Ｇ２を取得する。変換部１０２は、振動データＧ１、Ｇ２にフーリエ変換を行う。検出部１０６は、変換部１０２によって生成された第１スペクトルＦ１と第２スペクトルＦ２とに基づき、構造体４の異常の発生を検出する。構造体４は、少なくとも下端が支持される。第１スペクトルＦ１は、第１加速度計３１の振動データＧ１に対応する。第２スペクトルＦ２は、第２加速度計３２の振動データＧ２に対応する。【選択図】図１
ABNORMALITY DETECTION DEVICE FOR STRUCTURE, ABNORMALITY DETECTION SYSTEM FOR STRUCTURE, ABNORMALITY DETECTION METHOD FOR STRUCTURE, AND ABNORMALITY DETECTION PROGRAM FOR STRUCTURE
構造体の異常検出装置、構造体の異常検出システム、構造体の異常検出方法、及び構造体の異常検出プログラム
KAWAI TADAO (author) / KAWADA KOJI (author) / KOBAYASHI TOSHIYUKI (author) / KAWAHIRA TAKAO (author) / SHIBATA TOSHIHARU (author) / HIDAKA KAZUO (author)
2019-04-11
Patent
Electronic Resource
Japanese
IPC:
E01D
BRIDGES
,
Brücken
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