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    Scanning Tunneling Microscopy of Cubic Silicon Carbide Surfaces. (Reannouncement with New Availability Information)

    New search for: C. S. Chang
    New search for: N. J. Zheng
    New search for: I. S. Tsong
    New search for: Y. C. Wang
    New search for: R. F. Davis

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    Scanning Tunneling Microscopy of Cubic Silicon Carbide Surfaces. (Reannouncement with New Availability Information)

    New search for: C. S. Chang
    New search for: N. J. Zheng
    New search for: I. S. Tsong
    New search for: Y. C. Wang
    New search for: R. F. Davis

    Access

    Access via TIB
    Check availability in my library

    Scanning Tunneling Microscopy of Cubic Silicon Carbide Surfaces. (Reannouncement with New Availability Information)

    New search for: C. S. Chang
    New search for: N. J. Zheng
    New search for: I. S. Tsong
    New search for: Y. C. Wang
    New search for: R. F. Davis

    Access

    Access via TIB
    Check availability in my library

    Access

    Access via TIB
    Check availability in my library

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Scanning Tunneling Microscopy of Cubic Silicon Carbide Surfaces. (Reannouncement with New Availability Information)

    Contributors:

    C. S. Chang (author) / N. J. Zheng (author) / I. S. Tsong (author) / Y. C. Wang (author) / R. F. Davis (author)

    Publication date:

    1990

    Size:

    6 pages

    Type of media:

    Report

    Type of material:

    No indication

    Language:

    English

    Keywords:

    Solid State Physics , Ceramics, Refractories, & Glass , Silicon carbides , Reprints , Scanning tunneling microscopy , Surfaces , Cubic lattices

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