A platform for research: civil engineering, architecture and urbanism
This is the final report of research activities on Tunneling Microscopy of Semiconductor Surfaces, accomplished during a 3-year JSEP Graduate Fellowship awarded to Silva K. (Leonard) Theiss for work in the Harvard JSEP Laboratory under the guidance of Prof. J. Golovchenko. The work includes: construction of a two-tip tunneling microscope, study of low coverage phases of Pb on Si(lll), study of surface diffusion of Pb on Ge(lll)-c(2x8), and study of Ge growth on Si(lll). Tunneling microscopy, Semiconductor surfaces, Surface diffusion.
This is the final report of research activities on Tunneling Microscopy of Semiconductor Surfaces, accomplished during a 3-year JSEP Graduate Fellowship awarded to Silva K. (Leonard) Theiss for work in the Harvard JSEP Laboratory under the guidance of Prof. J. Golovchenko. The work includes: construction of a two-tip tunneling microscope, study of low coverage phases of Pb on Si(lll), study of surface diffusion of Pb on Ge(lll)-c(2x8), and study of Ge growth on Si(lll). Tunneling microscopy, Semiconductor surfaces, Surface diffusion.
Tunneling Microscopy of Semiconductors
S. K. Theiss (author)
1993
4 pages
Report
No indication
English
Springer Verlag | 1988
|Atomic-Scale Studies of Point Defects in Compound Semiconductors by Scanning Tunneling Microscopy
British Library Online Contents | 1995
|Springer Verlag | 1986
|Atomic Force Microscopy/Scanning Tunneling Microscopy
TIBKAT | 1994
|Scanning Tunneling Optical Microscopy
Springer Verlag | 1990
|