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Impedance Metrology and the Ac Quantum Hall Effect
Impedance Metrology and the Ac Quantum Hall Effect
Impedance Metrology and the Ac Quantum Hall Effect
Delahaye, F. (Autor:in) / Melcher, J. (Autor:in) / National Conference of Standards Laboratories
Workshop and symposium, National Conference of Standards Laboratories: Success in the 21st Century depends on modern metrology ; 1997 ; Atlanta; GA
01.01.1997
6 pages
Aufsatz (Konferenz)
Englisch
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