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Impedance Metrology and the Ac Quantum Hall Effect

Delahaye, F. / Melcher, J. / National Conference of Standards Laboratories

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Impedance Metrology and the Ac Quantum Hall Effect

Delahaye, F. / Melcher, J. / National Conference of Standards Laboratories

Impedance Metrology and the Ac Quantum Hall Effect

Delahaye, F. / Melcher, J. / National Conference of Standards Laboratories

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Access via TIB

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Document information

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Document information

Title:

Impedance Metrology and the Ac Quantum Hall Effect

Contributors:

Delahaye, F. (author) / Melcher, J. (author) / National Conference of Standards Laboratories

Conference:

Workshop and symposium, National Conference of Standards Laboratories: Success in the 21st Century depends on modern metrology ; 1997 ; Atlanta; GA

Published in:

National Conference of Standards Laboratories: Success in the 21st Century depends on modern metrology ; 737-742

WORKSHOP AND SYMPOSIUM- NATIONAL CONFERENCE OF STANDARDS LABORATORIES ; 2

Publication date:

1997-01-01

Size:

6 pages

Type of media:

Conference paper

Type of material:

Language:

English

Keywords:

modern metrology , standards laboratories , success

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