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Determination of geometric properties of SNOM tips by means of far-field evaluation [4098-16]
Determination of geometric properties of SNOM tips by means of far-field evaluation [4098-16]
Determination of geometric properties of SNOM tips by means of far-field evaluation [4098-16]
Seebacher, S. (Autor:in) / Osten, W. (Autor:in) / Juptner, W. P. (Autor:in) / Veiko, V. P. (Autor:in) / Voznessenski, N. B. (Autor:in) / Andrews, D. L. / SPIE - International Society for Optical Engineering
Conference, Optical devices and diagnostics in materials science ; 2000 ; San Diego, CA
01.01.2000
11 pages
Aufsatz (Konferenz)
Englisch
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