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    Determination of geometric properties of SNOM tips by means of far-field evaluation [4098-16]

    New search for: Seebacher, S.
    New search for: Osten, W.
    New search for: Juptner, W. P.
    New search for: Veiko, V. P.
    New search for: Voznessenski, N. B.
    New search for: Andrews, D. L.

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    Determination of geometric properties of SNOM tips by means of far-field evaluation [4098-16]

    New search for: Seebacher, S.
    New search for: Osten, W.
    New search for: Juptner, W. P.
    New search for: Veiko, V. P.
    New search for: Voznessenski, N. B.
    New search for: Andrews, D. L.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Determination of geometric properties of SNOM tips by means of far-field evaluation [4098-16]

    New search for: Seebacher, S.
    New search for: Osten, W.
    New search for: Juptner, W. P.
    New search for: Veiko, V. P.
    New search for: Voznessenski, N. B.
    New search for: Andrews, D. L.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
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    Document information
    Title:

    Determination of geometric properties of SNOM tips by means of far-field evaluation [4098-16]

    Contributors:

    Seebacher, S. (author) / Osten, W. (author) / Juptner, W. P. (author) / Veiko, V. P. (author) / Voznessenski, N. B. (author) / Andrews, D. L. / SPIE - International Society for Optical Engineering

    Conference:

    Conference, Optical devices and diagnostics in materials science ; 2000 ; San Diego, CA

    Published in:

    Optical devices and diagnostics in materials science ; 110-120

    PROCEEDINGS- SPIE THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING ; 4098

    Publication date:

    2000-01-01

    Size:

    11 pages

    ISBN:

    0819437433

    ISSN:

    0277-786X

    Type of media:

    Conference paper

    Type of material:

    Print

    Language:

    English

    Keywords:

    optical devices , SPIE , materials science , optical engineering

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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