Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Interface characterization of strained InGaAs/InP quantum wells after a growth interruption sequence
Interface characterization of strained InGaAs/InP quantum wells after a growth interruption sequence
Interface characterization of strained InGaAs/InP quantum wells after a growth interruption sequence
Schwedler, R. (Autor:in) / Gallmann, B. (Autor:in) / Wolter, K. (Autor:in) / Kohl, A. (Autor:in)
APPLIED SURFACE SCIENCE ; 63 ; 187
01.01.1993
187 pages
Aufsatz (Zeitschrift)
Unbekannt
DDC:
621.35
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
British Library Online Contents | 1993
|Evidence for non-uniform interface thickness in strained InGaAs/InP quantum wells
British Library Online Contents | 1993
|Optical studies of strained InGaAs/GaAs single quantum wells
British Library Online Contents | 1994
|Critical layer thickness in MOCVD grown InGaAs-GaAs strained quantum wells
British Library Online Contents | 1995
|British Library Online Contents | 1993
|