Determination of stoichiometry and oxygen content in platelike and octahedral oxygen precipitates in silicon with FT-IT spectroscopy

De Gryse, O. / Clauws, P. / Vanhellemont, J. et al. | British Library Online Contents | 1997

Non-destructive diagnostic techniques for oxygen precipitates in Czochralski silicon

Bazzali, A. / Borionetti, G. / Falster, R. et al. | British Library Online Contents | 2001

Germanium-doped Czochralski silicon: Oxygen precipitates and their annealing behavior

Chen, J. / Yang, D. / Li, H. et al. | British Library Online Contents | 2006

Photoluminescence of Ring-Distribution of Oxygen Precipitates in Czochralski Silicon

Terashima, K. / Ikarashi, T. / Ono, H. et al. | British Library Online Contents | 1995

Infrared characterization of oxygen precipitates in silicon wafers with different concentrations of interstitial oxygen

Borghesi, A. / Sassella, A. / Geranzani, P. et al. | British Library Online Contents | 2000