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Non-destructive diagnostic techniques for oxygen precipitates in Czochralski silicon
Non-destructive diagnostic techniques for oxygen precipitates in Czochralski silicon
Non-destructive diagnostic techniques for oxygen precipitates in Czochralski silicon
Bazzali, A. (Autor:in) / Borionetti, G. (Autor:in) / Falster, R. (Autor:in) / Gambaro, D. (Autor:in) / Mule`Stagno, L. (Autor:in) / Olmo, M. (Autor:in) / Orizio, R. (Autor:in) / Porrini, M. (Autor:in)
MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING ; 4 ; 23-26
01.01.2001
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.38152
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