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A photoemission study of erbium silicide ultra-thin films epitaxially grown on Si(111)
A photoemission study of erbium silicide ultra-thin films epitaxially grown on Si(111)
A photoemission study of erbium silicide ultra-thin films epitaxially grown on Si(111)
Veuillen, J.-Y. (Autor:in) / Lollman, D. B. B. (Autor:in) / Nguyen Tan, T. A. (Autor:in) / Magaud, L. (Autor:in)
APPLIED SURFACE SCIENCE ; 65//66 ; 712
01.01.1993
712 pages
Aufsatz (Zeitschrift)
Unbekannt
DDC:
621.35
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