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Copper Precipitation at the Silicon/Silicon Dioxide Interface: Microstructure and Electrical Properties
Copper Precipitation at the Silicon/Silicon Dioxide Interface: Microstructure and Electrical Properties
Copper Precipitation at the Silicon/Silicon Dioxide Interface: Microstructure and Electrical Properties
Correia, A. (Autor:in) / Ballutaud, D. (Autor:in) / Maurice, J. L. (Autor:in) / Komninou, P. / Rocher, A.
01.01.1993
591 pages
Aufsatz (Zeitschrift)
Unbekannt
DDC:
620.11
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