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    Copper Precipitation at the Silicon/Silicon Dioxide Interface: Microstructure and Electrical Properties

    New search for: Correia, A.
    New search for: Ballutaud, D.
    New search for: Maurice, J. L.
    New search for: Komninou, P.
    New search for: Rocher, A.

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    Copper Precipitation at the Silicon/Silicon Dioxide Interface: Microstructure and Electrical Properties

    New search for: Correia, A.
    New search for: Ballutaud, D.
    New search for: Maurice, J. L.
    New search for: Komninou, P.
    New search for: Rocher, A.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Copper Precipitation at the Silicon/Silicon Dioxide Interface: Microstructure and Electrical Properties

    New search for: Correia, A.
    New search for: Ballutaud, D.
    New search for: Maurice, J. L.
    New search for: Komninou, P.
    New search for: Rocher, A.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Copper Precipitation at the Silicon/Silicon Dioxide Interface: Microstructure and Electrical Properties

    Contributors:

    Correia, A. (author) / Ballutaud, D. (author) / Maurice, J. L. (author) / Komninou, P. / Rocher, A.

    Published in:

    Intergranular and Interphase Boundaries in Materials ; 591

    MATERIALS SCIENCE FORUM

    Publication date:

    1993-01-01

    Size:

    591 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    Unknown

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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