Rietveld Texture and Stress Analysis of Thin Films by X-Ray Diffraction

Lutterotti, L. / Matthies, S. / Chateigner, D. et al. | British Library Online Contents | 2002

Stress and Texture Analysis in Thin Films and Coatings by X-Ray Diffraction

Pina, J. C. P. / Marques, M. J. / dos Santos, J. M. M. et al. | British Library Online Contents | 2006

Texture in Thin Films

Detavernier, C. / Lavoie, C. | British Library Online Contents | 2005

Quantitative Texture Measurements Using Neutron Time-Of-Flight Diffraction

Vogel, S. C. / Hartig, C. / Von Dreele, R. B. et al. | British Library Online Contents | 2005

Texture Analysis from Diffraction Spectra

Wenk, H.-R. / Matthies, S. / Lutterotti, L. | British Library Online Contents | 1994