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Optimization of the Texture Determination of Thin Films from X-Ray Diffraction Measurements

Moreau, B. / Wagner, F. / Goebel, H.

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Optimization of the Texture Determination of Thin Films from X-Ray Diffraction Measurements

Moreau, B. / Wagner, F. / Goebel, H.

Optimization of the Texture Determination of Thin Films from X-Ray Diffraction Measurements

Moreau, B. / Wagner, F. / Goebel, H.

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Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Optimization of the Texture Determination of Thin Films from X-Ray Diffraction Measurements

Contributors:

Moreau, B. (author) / Wagner, F. (author) / Goebel, H. (author)

Published in:

MATERIALS SCIENCE FORUM ; 159

Publication date:

1994-01-01

Size:

159 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

Unknown

Classification:

DDC: 620.11

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