Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
X-ray photoelectron spectroscopic and atomic force microscopic study of GaAs etching with a HCl solution
X-ray photoelectron spectroscopic and atomic force microscopic study of GaAs etching with a HCl solution
X-ray photoelectron spectroscopic and atomic force microscopic study of GaAs etching with a HCl solution
Song, Z. (Autor:in) / Shogen, S. (Autor:in) / Kawasaki, M. (Autor:in) / Suemune, I. (Autor:in)
APPLIED SURFACE SCIENCE ; 82/83 ; 250
01.01.1994
250 pages
Aufsatz (Zeitschrift)
Unbekannt
DDC:
621.35
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Atomic force microscopic imaging and wet etching of Bi2Ti2O7 thin films
British Library Online Contents | 2003
|Atomic force microscopic study of directional SrSO~4(001) surface and its etching property
British Library Online Contents | 1994
|British Library Online Contents | 2002
|Raman spectroscopic and atomic force microscopic study of graphite ablation at 193 and 248 nm
British Library Online Contents | 2000
|British Library Online Contents | 2002
|