Characterization of vacancy-like defects in boron-implanted silicon with slow positrons

Gebauer, J. / Eichler, S. / Krause-Rehberg, R. et al. | British Library Online Contents | 1997

Evolution of Defect Profiles in He-Implanted Silicon Studied by Slow Positrons

Brusa, R. S. / Karwasz, G. P. / Tiengo, N. et al. | British Library Online Contents | 1997

Aluminium nitride layers investigated by slow positrons

Saleh, A. S. / Rice-Evans, P. C. / Bull, S. J. | British Library Online Contents | 1995

Characterization of H-related defects in H-implanted Si with slow positrons

Fujinami, M. / Suzuki, R. / Ohdaira, T. et al. | British Library Online Contents | 1999

Defect Profiling with Low Energy Positrons of Nitrogen Implanted Silicon

Van der Werf, D. P. / Saleh, A. S. / Towner, A. et al. | British Library Online Contents | 1997