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    Thermal Evolution of Defects in H-Implanted Silicon Investigated by Slow Positrons

    New search for: Brusa, R. S.
    New search for: Zecca, A.
    New search for: Meng, X. T.
    New search for: Ottaviani, G.
    New search for: He, Y.-J.
    New search for: Cao, B.-S.
    New search for: Jean, Y. C.

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    Thermal Evolution of Defects in H-Implanted Silicon Investigated by Slow Positrons

    New search for: Brusa, R. S.
    New search for: Zecca, A.
    New search for: Meng, X. T.
    New search for: Ottaviani, G.
    New search for: He, Y.-J.
    New search for: Cao, B.-S.
    New search for: Jean, Y. C.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Thermal Evolution of Defects in H-Implanted Silicon Investigated by Slow Positrons

    New search for: Brusa, R. S.
    New search for: Zecca, A.
    New search for: Meng, X. T.
    New search for: Ottaviani, G.
    New search for: He, Y.-J.
    New search for: Cao, B.-S.
    New search for: Jean, Y. C.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Check availability in my library
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    Document information
    Title:

    Thermal Evolution of Defects in H-Implanted Silicon Investigated by Slow Positrons

    Contributors:

    Brusa, R. S. (author) / Zecca, A. (author) / Meng, X. T. (author) / Ottaviani, G. (author) / He, Y.-J. / Cao, B.-S. / Jean, Y. C.

    Published in:

    Positron Annihilation ICPA-10 ; 141

    MATERIALS SCIENCE FORUM

    Publication date:

    1995-01-01

    Size:

    141 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    Unknown

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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