Time-of-flight secondary ion mass spectrometry (TOF-SIMS) for high-throughput characterization of biosurfaces

Roberson, S. / Sehgal, A. / Fahey, A. et al. | British Library Online Contents | 2003

SIMS: Secondary Ion Mass Spectrometry

Kudo, M. / Nagayama, S. | British Library Online Contents | 1993

SIMS — Secondary Ion Mass Spectrometry

MacDonald, R. J. / King, B. V. | Springer Verlag | 1992

Investigation into the nature of historical tapestries using time of flight secondary ion mass spectrometry (ToF-SIMS)

Batcheller, J. / Hacke, A. M. / Mitchell, R. et al. | British Library Online Contents | 2006

Concentration of N and P in SiC Investigated by Time-Of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)

Acarturk, T. / Semmelroth, K. / Pensl, G. et al. | British Library Online Contents | 2005