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Investigation into the nature of historical tapestries using time of flight secondary ion mass spectrometry (ToF-SIMS)
Investigation into the nature of historical tapestries using time of flight secondary ion mass spectrometry (ToF-SIMS)
Investigation into the nature of historical tapestries using time of flight secondary ion mass spectrometry (ToF-SIMS)
Batcheller, J. (Autor:in) / Hacke, A. M. (Autor:in) / Mitchell, R. (Autor:in) / Carr, C. M. (Autor:in)
APPLIED SURFACE SCIENCE ; 252 ; 7113-7116
01.01.2006
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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