Accurate Evaluation Techniques of the Interstitial Oxygen Concentrations in the Oxygen Precipitated and the Low-Resistivity CZ-Si Crystals

Kitagawara, Y. / Takamizawa, K. / Takenaka, T. | British Library Online Contents | 1993

Resistivity Mapping of Semi-Insulating 6H-SiC Wafers

Roth, M. D. / Heydemann, V. D. / Mitchel, W. C. et al. | British Library Online Contents | 2002

Optical absorption of precipitated oxygen in silicon at liquid helium temperature

Sassella, A. / Borghesi, A. / Borionetti, G. et al. | British Library Online Contents | 2000

Resistivity Distribution in Undoped 6H-SiC Boules and Wafers

Li, Q. / Polyakov, A. Y. / Skowronski, M. et al. | British Library Online Contents | 2006

Influence of Oxygen on External Phosphorus Gettering in Disordered Silicon Wafers

Martinuzzi, S. / Perichaud, I. | British Library Online Contents | 1993