Finite elements analysis of heteroepitaxial SiGe layers grown by excimer laser

Conde, J. C. / Gonzalez, P. / Lusquinos, F. et al. | British Library Online Contents | 2005

Strain relaxation through islands formation in epitaxial SiGe thin films

Barucca, G. / Lucchetti, L. / Majni, G. et al. | British Library Online Contents | 1996

Surface Roughening of Heteroepitaxial Thin Films

Gao, H. / Nix, W. D. | British Library Online Contents | 1999

Strain Relaxation and Induced Defects in SiGe Thin Films Grown on Ion-Implanted Si Substrates

Yamanaka, J. / Sawano, K. / Nakagawa, K. et al. | British Library Online Contents | 2004

Simultaneous optical measurement of Germanium content and Boron doping in strained heteroepitaxial SiGe films using a novel data-analysis technique

Morris, S. J. / Fougeres, P. / Bozzo-Escoubas, S. et al. | British Library Online Contents | 2004