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Rapid thermal post-metallization annealing effect on thin gate oxides
Rapid thermal post-metallization annealing effect on thin gate oxides
Rapid thermal post-metallization annealing effect on thin gate oxides
Jeng, M.-J. (Autor:in) / Lin, H.-S. (Autor:in) / Hwu, J.-G. (Autor:in)
APPLIED SURFACE SCIENCE ; 92 ; 208-211
01.01.1996
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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