Oxide thin films formed during rotational AES sputter depth profiling of Ni/Cr multilayers using oxygen ions

Zalar, A. / Seibt, E. W. / Panjan, P. | British Library Online Contents | 1996

Sputter Depth Profiling

King, B. V. | Springer Verlag | 1992

Method for sputter rate determination in sputter depth profiling

Lopez, F. / Garcia-Cuenca, M. V. / Asensi, J. M. et al. | British Library Online Contents | 1993

Method for sputter rate determination in sputter depth profiling

Lopez, F. / Garcia-Cuenca, M. V. / Asensi, J. M. et al. | British Library Online Contents | 1993

Sputter profiling of AlGaAs/GaAs superlattice structures using oxygen and argon ions

Linnarsson, M. K. / Svensson, B. G. / Andersson, T. G. et al. | British Library Online Contents | 1993