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Analytical studies of nickel silicide formation through a thin Ti layer
Analytical studies of nickel silicide formation through a thin Ti layer
Analytical studies of nickel silicide formation through a thin Ti layer
Fenske, F. (Autor:in) / Schoepke, A. (Autor:in) / Schulze, S. (Autor:in) / Selle, B. (Autor:in)
APPLIED SURFACE SCIENCE ; 104/105 ; 218-222
01.01.1996
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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