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    Analytical studies of nickel silicide formation through a thin Ti layer

    New search for: Fenske, F.
    New search for: Schoepke, A.
    New search for: Schulze, S.
    New search for: Selle, B.

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    Analytical studies of nickel silicide formation through a thin Ti layer

    New search for: Fenske, F.
    New search for: Schoepke, A.
    New search for: Schulze, S.
    New search for: Selle, B.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Analytical studies of nickel silicide formation through a thin Ti layer

    New search for: Fenske, F.
    New search for: Schoepke, A.
    New search for: Schulze, S.
    New search for: Selle, B.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Analytical studies of nickel silicide formation through a thin Ti layer

    Contributors:

    Fenske, F. (author) / Schoepke, A. (author) / Schulze, S. (author) / Selle, B. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 104/105 ; 218-222

    Publication date:

    1996-01-01

    Size:

    5 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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