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Thermal drift of piezoresistive properties of LPCVD polysilicon thin films between room temperature and 200C
Thermal drift of piezoresistive properties of LPCVD polysilicon thin films between room temperature and 200C
Thermal drift of piezoresistive properties of LPCVD polysilicon thin films between room temperature and 200C
Kleimann, P. (Autor:in) / Semmache, B. (Autor:in) / Le Berre, M. (Autor:in) / Barbier, D. (Autor:in) / Camassel, J. / Fricke, K. / Krozer, V. / Robert, J. L.
01.01.1997
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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