Electromigration-induced strain relaxation in Cu conductor lines

Zhang, H. / Cargill, G.S. | British Library Online Contents | 2011

Electromigration Failure of Metal Lines

Abé, H. / Sasagawa, K. / Saka, M. | British Library Online Contents | 2006

Orientation and Microstructure Dependence of Electromigration Damage in Damascene Cu Interconnect Lines

Mirpuri, K. K. / Szpunar, J. A. | British Library Online Contents | 2005

Damage mechanics of electromigration induced failure

Basaran, C. / Lin, M. | British Library Online Contents | 2008

Crystal Texture and Electromigration Damage in Al-Based Interconnect Lines Studied by ACOM with the SEM

Lepper, M. / Von Glasow, A. / Piscevic, D. et al. | British Library Online Contents | 1998