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The Atomic Structure of Prismatic Planar Defects in GaN/AlN Grown over Silicon Carbide and Sapphire Substrates
The Atomic Structure of Prismatic Planar Defects in GaN/AlN Grown over Silicon Carbide and Sapphire Substrates
The Atomic Structure of Prismatic Planar Defects in GaN/AlN Grown over Silicon Carbide and Sapphire Substrates
Nouet, G. (Autor:in) / Vermaut, P. (Autor:in) / Potin, V. (Autor:in) / Ruterana, P. (Autor:in) / Salvador, A. (Autor:in) / Morkoc, H. (Autor:in)
MATERIALS SCIENCE FORUM ; 264/268 ; 1247-1250
01.01.1998
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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