The Atomic Structure of Prismatic Planar Defects in GaN/AlN Grown over Silicon Carbide and Sapphire Substrates: Fid-Bau Portal

The Atomic Structure of Prismatic Planar Defects in GaN/AlN Grown over Silicon Carbide and Sapphire Substrates

Nouet, G. / Vermaut, P. / Potin, V. / Ruterana, P. / Salvador, A. / Morkoc, H.

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The Atomic Structure of Prismatic Planar Defects in GaN/AlN Grown over Silicon Carbide and Sapphire Substrates

Nouet, G. / Vermaut, P. / Potin, V. / Ruterana, P. / Salvador, A. / Morkoc, H.

The Atomic Structure of Prismatic Planar Defects in GaN/AlN Grown over Silicon Carbide and Sapphire Substrates

Nouet, G. / Vermaut, P. / Potin, V. / Ruterana, P. / Salvador, A. / Morkoc, H.

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Document information

Title:

The Atomic Structure of Prismatic Planar Defects in GaN/AlN Grown over Silicon Carbide and Sapphire Substrates

Contributors:

Nouet, G. (author) / Vermaut, P. (author) / Potin, V. (author) / Ruterana, P. (author) / Salvador, A. (author) / Morkoc, H. (author)

Published in:

MATERIALS SCIENCE FORUM ; 264/268 ; 1247-1250

Publication date:

1998-01-01

Size:

4 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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