Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Formation of ultra shallow donors in silicon by long-term-annealing at 470 C
Formation of ultra shallow donors in silicon by long-term-annealing at 470 C
Formation of ultra shallow donors in silicon by long-term-annealing at 470 C
Aaberg, D. (Autor:in) / Hallberg, T. (Autor:in) / Svensson, B. G. (Autor:in) / Lindstroem, J. L. (Autor:in) / Kleverman, M. (Autor:in)
MATERIALS SCIENCE FORUM ; 258/263 ; 385-390
01.01.1997
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
British Library Online Contents | 2004
|Electronic Raman Studies of Shallow Donors in Silicon Carbide
British Library Online Contents | 2006
|Oxygen in silicon carbide: shallow donors and deep acceptors
British Library Online Contents | 1999
|Non-melt laser annealing of Plasma Implanted Boron for ultra shallow junctions in Silicon
British Library Online Contents | 2008
|British Library Online Contents | 2017
|