Formation of TiSi"2 thin films on stressed (001)Si substrates

Cheng, S.L. / Huang, H.Y. / Peng, Y.C. et al. | British Library Online Contents | 1999

Scanning Tunneling Microscope - Atomic Force Microscope

Masuda, H. | British Library Online Contents | 1993

Depth Profiling of Thin TiSi~x-Films on Silicon Carbide by SNMS

Getto, R. / Freytag, J. / Kopnarski, M. et al. | British Library Online Contents | 1998

Atomic force microscope study of carbon thin films prepared by pulsed laser deposition

Yoshitake, T. / Nishiyama, T. / Aoki, H. et al. | British Library Online Contents | 1999

Direct observation of phase transition of GeSbTe thin films by Atomic Force Microscope

Yang, F. / Xu, L. / Zhang, R. et al. | British Library Online Contents | 2012