A platform for research: civil engineering, architecture and urbanism
Atomic force microscope investigation of the thermal stability of thin TiSi~2 films
Atomic force microscope investigation of the thermal stability of thin TiSi~2 films
Atomic force microscope investigation of the thermal stability of thin TiSi~2 films
Amorsolo, A. V. (author) / Funkenbusch, P. D. (author) / Kadin, A. M. (author)
JOURNAL OF MATERIALS RESEARCH -PITTSBURGH- ; 13 ; 1938-1949
1998-01-01
12 pages
Article (Journal)
English
DDC:
620.11
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Formation of TiSi"2 thin films on stressed (001)Si substrates
British Library Online Contents | 1999
|Scanning Tunneling Microscope - Atomic Force Microscope
British Library Online Contents | 1993
|Depth Profiling of Thin TiSi~x-Films on Silicon Carbide by SNMS
British Library Online Contents | 1998
|Atomic force microscope study of carbon thin films prepared by pulsed laser deposition
British Library Online Contents | 1999
|Direct observation of phase transition of GeSbTe thin films by Atomic Force Microscope
British Library Online Contents | 2012
|