Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Characterization of rapid thermal processing oxynitrides by SIMS and XPS analyses
Characterization of rapid thermal processing oxynitrides by SIMS and XPS analyses
Characterization of rapid thermal processing oxynitrides by SIMS and XPS analyses
Bersani, M. (Autor:in) / Vanzetti, L. (Autor:in) / Sbetti, M. (Autor:in) / Anderle, M. (Autor:in)
APPLIED SURFACE SCIENCE ; 144 ; 301-305
01.01.1999
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Formation of niobium oxynitrides by rapid thermal processing (RTP)
British Library Online Contents | 2005
|D-SIMS and ToF-SIMS quantitative depth profiles comparison on ultra thin oxynitrides
British Library Online Contents | 2003
|Ordered Mesoporous Silicon Oxynitrides
British Library Online Contents | 2001
|Formation of barium-tantalum oxynitrides
British Library Online Contents | 1994
|British Library Online Contents | 2005
|