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Correlation of electrical and microstructural properties after high dose aluminium implantation into 6H-SiC
Correlation of electrical and microstructural properties after high dose aluminium implantation into 6H-SiC
Correlation of electrical and microstructural properties after high dose aluminium implantation into 6H-SiC
Panknin, D. (Autor:in) / Wirth, H. (Autor:in) / Mucklich, A. (Autor:in) / Skorupa, W. (Autor:in)
MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- B ; 61-62 ; 363 - 367
01.01.1999
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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