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Measurements of thermal diffusivity of boron-silicon film-on-glass structure using phase detection method of photothermal deflection spectroscopy
Measurements of thermal diffusivity of boron-silicon film-on-glass structure using phase detection method of photothermal deflection spectroscopy
Measurements of thermal diffusivity of boron-silicon film-on-glass structure using phase detection method of photothermal deflection spectroscopy
Shi, B. X. (Autor:in) / Ong, C. W. (Autor:in) / Tam, K. L. (Autor:in)
JOURNAL OF MATERIALS SCIENCE ; 34 ; 5169-5174
01.01.1999
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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