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Thermal diffusivity of surface-microstructured silicon measured by photothermal deflection technique
Thermal diffusivity of surface-microstructured silicon measured by photothermal deflection technique
Thermal diffusivity of surface-microstructured silicon measured by photothermal deflection technique
MATERIALS LETTERS ; 60 ; 63-66
01.01.2006
4 pages
Aufsatz (Zeitschrift)
Englisch
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