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    Measurements of thermal diffusivity of boron-silicon film-on-glass structure using phase detection method of photothermal deflection spectroscopy

    New search for: Shi, B. X.
    New search for: Ong, C. W.
    New search for: Tam, K. L.

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    Measurements of thermal diffusivity of boron-silicon film-on-glass structure using phase detection method of photothermal deflection spectroscopy

    New search for: Shi, B. X.
    New search for: Ong, C. W.
    New search for: Tam, K. L.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Measurements of thermal diffusivity of boron-silicon film-on-glass structure using phase detection method of photothermal deflection spectroscopy

    New search for: Shi, B. X.
    New search for: Ong, C. W.
    New search for: Tam, K. L.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
    Similar titles

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    Document information
    Title:

    Measurements of thermal diffusivity of boron-silicon film-on-glass structure using phase detection method of photothermal deflection spectroscopy

    Contributors:

    Shi, B. X. (author) / Ong, C. W. (author) / Tam, K. L. (author)

    Published in:

    JOURNAL OF MATERIALS SCIENCE ; 34 ; 5169-5174

    Publication date:

    1999-01-01

    Size:

    6 pages

    ISSN:

    0022-2461

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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