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Optical Characterization of 4H-SiC by Variable Angle of Incidence Spectroscopic Ellipsometry

Lindquist, O. P. A. / Arwin, H. / Forsberg, U. et al. | British Library Online Contents | 2000

Variable Angle Spectroscopic Ellipsometry investigation of CVD-grown monolayer graphene

Castriota, Marco / Politano, Grazia Giuseppina / Vena, Carlo et al. | British Library Online Contents | 2019

Temperature dependence of Mn1.56Co0.96Ni0.48O4 thin films optical properties by spectroscopic ellipsometry

Ma, Chao / Wang, Hong Guang / Zhao, Peng Jun et al. | British Library Online Contents | 2014

Temperature dependence of Mn1.56Co0.96Ni0.48O4 thin films optical properties by spectroscopic ellipsometry

Ma, C. / Wang, H. G. / Zhao, P. J. et al. | British Library Online Contents | 2014