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    Optical dispersion analysis of TiO"2 thin films based on variable-angle spectroscopic ellipsometry measurements

    New search for: Mardare, D.
    New search for: Hones, P.

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    Optical dispersion analysis of TiO"2 thin films based on variable-angle spectroscopic ellipsometry measurements

    New search for: Mardare, D.
    New search for: Hones, P.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Optical dispersion analysis of TiO"2 thin films based on variable-angle spectroscopic ellipsometry measurements

    New search for: Mardare, D.
    New search for: Hones, P.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Check availability in my library
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    Document information
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    Document information
    Title:

    Optical dispersion analysis of TiO"2 thin films based on variable-angle spectroscopic ellipsometry measurements

    Contributors:

    Mardare, D. (author) / Hones, P. (author)

    Published in:

    MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- B ; 68 ; 42 - 47

    Publication date:

    1999-01-01

    Size:

    6 pages

    ISSN:

    0921-5107

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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