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TEM characterisation of high pressure-high-temperature-treated Czochralski silicon samples
TEM characterisation of high pressure-high-temperature-treated Czochralski silicon samples
TEM characterisation of high pressure-high-temperature-treated Czochralski silicon samples
Romano-Rodriguez, A. (Autor:in) / Bachrouri, A. (Autor:in) / Lopez, M. (Autor:in) / Morante, J. R. (Autor:in) / Misiuk, A. (Autor:in) / Surma, B. (Autor:in) / Jun, J. (Autor:in)
MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- B ; 73 ; 250 - 254
01.01.2000
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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